The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Jun. 15, 2018
Shimadzu Research Laboratory(shanghai) Co., Ltd., Shanghai, CN;
Kent James Gillig, Shanghai, CN;
Keke Wang, Shanghai, CN;
Wenjian Sun, Shanghai, CN;
Xiaoqiang Zhang, Shanghai, CN;
SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD., Shanghai, CN;
Abstract
The invention provides ion mobility analyzer and analysis method. The analyzer includes an ion source, a first drift/analyzer region provided with an ions entrance, a second drift/analyzer region provided with an ions exit, a connection region connecting the first drift/analyzer region and the second drift/analyzer region, and a detector connected to the ion exit. Direct current electric fields and gas flows in the first drift/analyzer region and the second drift/analyzer region apply opposing forces on ions, and first and second gas flows have the same gas flow direction. The connection region includes a third direct current electric field that causes ions to transfer from the first drift/analyzer region to the second drift/analyzer region. Because the first and second regions have the same gas flow direction, the invention achieves stable resolution and sensitivity as a high-resolution ion mobility analyzer and/or an ion mobility filter for a continuous ion beam.