The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Jan. 14, 2016
Applicant:

Transtech Systems, Inc., Latham, NY (US);

Inventors:

Donald D. Colosimo, Saratoga Springs, NY (US);

Sarah E. Pluta, Scotia, NY (US);

John W. Hewitt, Niskayuna, NY (US);

Assignee:

TransTech Systems, Inc., Latham, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/02 (2006.01); G01N 33/42 (2006.01); E01C 19/26 (2006.01);
U.S. Cl.
CPC ...
G01N 27/026 (2013.01); E01C 19/264 (2013.01); G01N 33/42 (2013.01);
Abstract

Systems and methods for measuring and monitoring physical properties of a material under test (MUT) from a vehicle, e.g., using complex electromagnetic impedance. Various embodiments include a method including: obtaining displacement data about a position of a sensor array relative to a material under test (MUT); comparing the displacement data with reference displacement data to determine whether the sensor array is at a reference distance relative to the MUT; in response to determining that the sensor array is located at the reference distance, instructing the sensor array to transmit a set of electromagnetic impedance signals into the MUT; obtaining a return electromagnetic impedance signal from the MUT; and calculating at least one physical property of the MUT based upon the transmitted set of electromagnetic impedance signals, the return electromagnetic impedance signals, and the displacement data.


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