The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Aug. 29, 2018
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Takahiro Doki, Kyoto, JP;
Kenji Kimura, Kyoto, JP;
Taro Shirai, Kyoto, JP;
Satoshi Sano, Kyoto, JP;
Akira Horiba, Kyoto, JP;
Naoki Morimoto, Kyoto, JP;
Assignee:
Shimadzu Corporation, Nakagyo-ku, Kyoto-shi, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/041 (2018.01); A61B 6/00 (2006.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
G01N 23/041 (2018.02); A61B 6/0407 (2013.01); A61B 6/4291 (2013.01); A61B 6/44 (2013.01); A61B 6/484 (2013.01); A61B 6/508 (2013.01); A61B 6/589 (2013.01); G01N 2223/3308 (2013.01); G01N 2223/40 (2013.01);
Abstract
The radiation phase contrast imaging apparatus includes an X-ray source, a first grating, a second grating arranged between the X-ray source and the first grating, and a moving mechanism for moving an object stage for holding an object. The moving mechanism is configured to more the object stage to an X-ray source side of the first grating and a second grating side of the first grating opposite to the source side of the first grating.