The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Mar. 31, 2015
The University of Tokyo, Tokyo, JP;
Kochi Prefectural Public University Corporation, Kochi-shi, Kochi, JP;
Toru Kurihara, Kochi, JP;
Shigeru Ando, Chiba, JP;
THE UNIVERSITY OF TOKYO, Tokyo, JP;
KOCHI PREFECTURAL PUBLIC UNIVERSITY CORPORATION, Kochi, JP;
RICOH ELEMEX CORPORATION, Aichi, JP;
Abstract
An inspection system of an embodiment includes: a planar illumination unit that temporally and spatially varies intensities of light in a periodic manner; a time-correlation image generator that generates a time-correlation image with a time-correlation camera or an image capturing system that performs an operation equivalent to that of the time-correlation camera; and a calculation processor that calculates a characteristic from the time-correlation image, the characteristic corresponding to a distribution of normal vectors to an inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface.