The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Oct. 31, 2018
Applicant:
Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Inventors:
Bryan D. Lee, Merrimack, NH (US);
Christopher M. Palie, Mont Vernon, NH (US);
Andrew J. Radl, Dunbarton, NH (US);
Assignee:
BAE Systems Information and Electronics Systems Integration Inc., Nashua, NH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/32 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1436 (2013.01); G01D 5/32 (2013.01); G01N 15/1459 (2013.01); G01N 2015/1447 (2013.01);
Abstract
A system and process for testing and analyzing a laser beam is provided. The system and process allows for repeatable testing of a laser beam to provide a beam intensity profile while accounting for variation in measurements attributable to outside factors. The system and process further allows for simultaneous measurement and analysis of a laser beam having multiple wavelengths.