The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Oct. 21, 2016
Applicant:
Kawano Lab. Inc., Osaka, JP;
Inventor:
Makoto Kawano, Ikeda, JP;
Assignee:
KAWANO Lab. Inc., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 9/00 (2006.01); G01N 15/10 (2006.01); G01N 15/14 (2006.01); G01N 27/72 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0211 (2013.01); G01N 9/00 (2013.01); G01N 15/0227 (2013.01); G01N 15/1031 (2013.01); G01N 15/1456 (2013.01); G01N 15/1468 (2013.01); G01N 27/72 (2013.01); G01N 2015/03 (2013.01);
Abstract
A particle analyzer () includes a measurement cell () and a measurement section (). The particle analyzer () further includes a migration section. The migration section includes magnets (and), electrodes (and), a power source (), and a laser light source (). The migration section causes migration of particles contained in a medium loaded into the measurement cell () by at least two of a magnetophoresis method, a dielectrophoresis method, an electromagnetophoresis method, and a photophoresis method. The measurement section () performs determination of a physical quantity of the particles and determination of a migration rate of the particles.