The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Jan. 22, 2019
Samsung Electronics Co., Ltd., Suwon-si, KR;
Hyeong Seok Jang, Seoul, KR;
Hyun Seok Moon, Seoul, KR;
Jae Wook Shim, Yongin-si, KR;
Kun Sun Eom, Yongin-si, KR;
Myoung Hoon Jung, Bucheon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
A method and an apparatus for analyzing a component of an object are provided. The apparatus includes an image sensor including an optical module, and the optical module includes a light source configured to emit a source light, a first detector configured to detect a first light that is scattered or reflected from the object on which the emitted source light is incident, and a second detector configured to detect a second light that is emitted by the light source but is not incident on the object. The apparatus further includes a processor configured to calculate a scattering coefficient and an absorption coefficient, based on the detected first light and the detected second light, and analyze the component of the object, based on the calculated scattering coefficient and the calculated absorption coefficient.