The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
May. 09, 2019
Applicant:
Trumpf Laser- Und Systemtechnik Gmbh, Ditzingen, DE;
Inventors:
Philipp Wagenblast, Leonberg, DE;
Matthias Allenberg-Rabe, Stuttgart, DE;
Assignee:
TRUMPF Laser- und Systemtechnik GmbH, Ditzingen, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01); B29C 64/153 (2017.01); B29C 64/268 (2017.01); G01J 1/04 (2006.01); G01J 1/44 (2006.01); G02B 5/126 (2006.01); G01B 11/00 (2006.01); B33Y 30/00 (2015.01); B22F 3/105 (2006.01); B33Y 10/00 (2015.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
G01J 1/4257 (2013.01); B22F 3/1055 (2013.01); B29C 64/153 (2017.08); B29C 64/268 (2017.08); B33Y 30/00 (2014.12); G01B 11/00 (2013.01); G01J 1/0407 (2013.01); G01J 1/44 (2013.01); G02B 5/126 (2013.01); B22F 2003/1056 (2013.01); B22F 2003/1057 (2013.01); B22F 2999/00 (2013.01); B33Y 10/00 (2014.12); B33Y 50/02 (2014.12); G01J 2001/446 (2013.01); Y02P 10/295 (2015.11);
Abstract
The present disclosure relates to a method for determining a beam profile of a laser beam, which is positioned by a scanner device in a processing field. The method includes: arranging at least one retroreflector in the processing field for irradiating powder layers of the scanner device; detecting laser radiation reflected back into the scanner device while the laser beam is scanned over the retroreflector; and determining the beam profile of the laser beam by using the laser radiation detected during the scanning travel over the retroreflector.