The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2020
Filed:
Apr. 26, 2017
Medit Corp., Seoul, KR;
Minho Chang, Seoul, KR;
Soobok Lee, Seoul, KR;
Jiwoong Chang, Seoul, KR;
Sungbin Im, Seoul, KR;
Euijeong Song, Seoul, KR;
Hansol Kim, Seoul, KR;
Seungjin Lee, Gunpo-si, KR;
MEDIT CORP., Seoul, KR;
Abstract
A three-dimensional scanning device including: a projection unit for projecting a wide-area pattern and a local pattern on an object to be measured; an image acquisition unit for acquiring an image of the object on which the wide-area pattern and the local pattern are projected; a detection unit for detecting the locations of a plurality of first IDs that are identifiers formed in the shape that can be distinguished utilizing image information in a space within a certain range in the image of the object, on which the wide-area pattern is projected, acquired by the image acquisition unit; a collection unit for collecting data on a brightness value within a predetermined certain distance with respect to the center point of the detected first ID; and an operation unit for determining a first ID value of the first ID using information of the collection unit.