The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Jun. 09, 2017
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Shigeto Murakami, Osaka, JP;

Masaki Fujiwara, Osaka, JP;

Takashi Nakatsukasa, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); H04N 5/247 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2513 (2013.01); H04N 5/247 (2013.01);
Abstract

Provided is a measuring device that can easily perform high-accuracy measurement at low cost. A stage is held on an installation part. A head unit including a light projecting unit and a light receiving unit, and the installation part are fixedly coupled together by a stand. A light shielding mechanism is attached to the stand in order to block ambient light. The light shielding mechanism includes a front cover member that covers a space on the stage from above. Point cloud data representing the three-dimensional shape of the measuring object is generated based on the light reception signal. Designation of a point to be measured in the measuring object is received, and a measurement value at the designated point is calculated based on the obtained point cloud data.


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