The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Apr. 26, 2017
Applicant:

Xl Photonics, Inc., Daejeon, KR;

Inventors:

Heung Ro Choo, Daejeon, KR;

Jeong Eun Jeon, Daejeon, KR;

Min Soo Kim, Daejeon, KR;

Assignee:

XL PHOTONICS, INC., Daejeon, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01B 11/25 (2006.01); G02B 26/00 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02 (2013.01); G01B 11/24 (2013.01); G01B 11/25 (2013.01); G02B 26/001 (2013.01);
Abstract

The present invention relates to a precision measurement system using an interferometer and an image, comprising: an interferometer for measuring a distance to a movable object by a transfer device; an imaging device which is fixed at a specific position and captures an image of an object located within a specific range; and a control device which calculates absolute coordinates indicating a distance from a reference point to each pixel of the image on the basis of the distance measured by the interferometer and the image obtained by the imaging device, calculates an absolute distance between the pixels of the image on the basis of the absolute coordinates, and measures a length of the object captured by the imaging device using the absolute coordinates or the absolute distance.


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