The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2020

Filed:

Jan. 05, 2018
Applicant:

North Carolina State University, Raleigh, NC (US);

Inventors:

Thomas A. Dow, Cary, NC (US);

Erik Zdanowicz, Pullman, WA (US);

Alexander Sohn, Fuquay-Varina, NC (US);

Ron Scattergood, Cary, NC (US);

William John Nowak, Jr., Cary, NC (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B21D 31/06 (2006.01); B29C 59/02 (2006.01); B29C 33/42 (2006.01); B81C 99/00 (2010.01); B29C 33/38 (2006.01); H01L 31/0232 (2014.01); B29L 31/00 (2006.01); B82Y 40/00 (2011.01); B21D 31/00 (2006.01); B29L 11/00 (2006.01);
U.S. Cl.
CPC ...
B29C 59/022 (2013.01); B21D 31/06 (2013.01); B29C 33/3878 (2013.01); B29C 33/424 (2013.01); B81C 99/0025 (2013.01); H01L 31/02325 (2013.01); B21D 31/005 (2013.01); B29C 2059/023 (2013.01); B29K 2995/0018 (2013.01); B29K 2995/0093 (2013.01); B29L 2011/00 (2013.01); B29L 2031/7562 (2013.01); B81C 2201/0153 (2013.01); B82Y 40/00 (2013.01);
Abstract

The subject matter described herein relates to methods and systems for fast imprinting of nanometer scale features in a workpiece. According to one aspect, a system for producing nanometer scale features in a workpiece is disclosed. The system includes a die having a surface with at least one nanometer scale feature located thereon. A first actuator moves the die with respect to the workpiece such that the at least one nanometer scale feature impacts the workpiece and imprints a corresponding at least one nanometer scale feature in the workpiece.


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