The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Feb. 13, 2019
Seiko Epson Corporation, Tokyo, JP;
Tetsuo Tatsuda, Ina, JP;
SEIKO EPSON CORPORATION, Tokyo, JP;
Abstract
An image quality inspection camera system includes: N (integer of N≥2) light sources that emit light on a medium; a camera for photographing the medium; and a control section, in which the control section executes setting processing when an i-th light source (integer of i=1 to N) is lit with a reference driving signal, for setting an image quality inspection time driving signal of the i-th light source, and the setting processing includes calculating an i-th representative luminance value by performing a predetermined representative luminance value calculation processing based on a luminance value of each pixel photographed by the camera when the i-th light source is lit with the reference driving signal, and determining the image quality inspection time driving signal of the i-th light source by adjusting the reference driving signal such that the i-th representative luminance value satisfies a predetermined target luminance value condition.