The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Mar. 27, 2019
Hcl Technologies Limited, Noida, IN;
Rahul Soundrarajan, Bengaluru, IN;
HCL Technologies Limited, Noida, Uttar Pradesh, unknown;
Abstract
Disclosed is a system for profiling one or more nodes based on a hybrid Key Performance Indicator (KPI). Initially, a flag indicating an issue with a KPI is received. A set of Configuration Management (CM) may be changed or identified by SME. Deviation in magnitude of each CM parameters from a predefined CM magnitude is computed to determine a changed CM parameter with deviation magnitude higher than deviation magnitude of remaining CM parameters. A set of Performance Management (PM) counters is identified by comparing magnitude of each PM with a predefined threshold value or using machine learning or statistical techniques. A hybrid KPI is created based on combination of the changed CM parameters and a subset of PM counters. One or more nodes are profiled by comparing the hybrid KPI associated to the node with hybrid KPI corresponding to each of the one or more nodes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile