The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Mar. 12, 2019
Applicant:

Pivotal Software, Inc., San Francisco, CA (US);

Inventors:

Onsi Joe Fakhouri, Denver, CO (US);

Amit Kumar Gupta, San Francisco, CA (US);

Colin Michael Humphreys, London, GB;

Assignee:

Pivotal Software, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/24 (2006.01); G06F 11/22 (2006.01); G06F 9/48 (2006.01); G06F 9/54 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
H04L 41/5012 (2013.01); G06F 9/4812 (2013.01); G06F 9/541 (2013.01); G06F 11/1458 (2013.01); G06F 11/2268 (2013.01);
Abstract

Methods, systems, and apparatus, including computer programs encoded on computer storage media, for computing availability metrics for an integrated service. One of the methods includes generating, for a service installed on a software platform, a plurality of availability logs, each availability log representing an occurrence of the service becoming unavailable. The plurality of availability logs are aggregated according to one or more aggregation criteria. The aggregated availability logs are processed to compute one or more availability metrics for the service, wherein each availability metric quantifies the availability of the service to process requests from the plurality of workloads in the presence of system failures and interruptions. An availability rating for the service is computed from the one or more availability metrics.


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