The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Jul. 17, 2018
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Matthew Evan Vogel, Seattle, WA (US);
Julie Christa Seto, North Bend, WA (US);
Daniel Escapa, Seattle, WA (US);
Hubert Van Hoof, Redmond, WA (US);
Dheepak Ramaswamy, Seattle, WA (US);
Brett Daniel Mills, Seattle, WA (US);
Joseph Anthony Beernink, Issaquah, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
A meeting insight computing system includes a meeting evaluation machine configured to collect quality parameters from meeting quality monitoring devices. The quality parameters each quantify meeting conditions during one or more previously-elapsed meetings and are usable to determine an overall quality score for each of the one or more previously-elapsed meetings. A graphical scheduling interface is configured to facilitate scheduling of an upcoming meeting at a designated meeting time, in a meeting location, and with one or more meeting participants. An insight generation machine is configured to report a meeting insight via the graphical scheduling interface. The meeting insight is based on the meeting time, the meeting location, the one or more meeting participants, and the quality parameters, and includes a recommendation to change one or more of the meeting time, meeting location, and meeting participants to improve a quality score of the upcoming meeting.