The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Jul. 31, 2018
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Gernot Hueber, Linz, AT;

Ian Thomas Macnamara, Graz, AT;

Assignee:

NXP B.V., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/21 (2015.01); G01R 31/28 (2006.01); G06F 7/48 (2006.01); G06F 7/544 (2006.01); H03M 1/10 (2006.01); H04B 1/00 (2006.01);
U.S. Cl.
CPC ...
H04B 17/21 (2015.01); G01R 31/2822 (2013.01); G06F 7/4818 (2013.01); G06F 7/5446 (2013.01); H03M 1/108 (2013.01); H04B 1/0017 (2013.01);
Abstract

This specification discloses methods and systems for implementing a chip integrated scope (i.e., chip scope (CS)), which is a feature that allows a user to scope RF signals (internally and externally to the DUT (device under test)), by using the RF receive path (including amplifier, filter, ADC, DSP) to capture and store signal traces. In some embodiments, this specification discloses methods and systems to enhance the resolution and accuracy of these signal traces by using raw and correction data for gain/phase compensation of gain/phase impairments introduced in the Rx (receiver) path. In some embodiments, the correction data is generated from one or more of the following: simulation data, characterization data, production test data.


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