The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Oct. 30, 2018
Applicant:
Renesas Electronics Corporation, Tokyo, JP;
Inventor:
Yukitoshi Tsuboi, Tokyo, JP;
Assignee:
RENESAS ELECTRONICS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/29 (2006.01); H03M 13/37 (2006.01); H03M 13/19 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
H03M 13/2906 (2013.01); G06F 11/1012 (2013.01); H03M 13/19 (2013.01); H03M 13/3738 (2013.01); H03M 13/616 (2013.01); H03M 13/6575 (2013.01); H03M 13/2957 (2013.01);
Abstract
The subject is to improve the detection performance in the error detection of data using an ECC. A data processing deviceincludes an encoder devicethat includes an encoder unit to generate an ECC by performing operations according to a first ECC generation matrix and an encoder unitto generate an ECC by performing operations according to a second ECC generation matrix obtained by permutating a column of the first ECC generation matrix. The encoder unitgenerates the first ECC for the first data. The encoder unitgenerates the second ECC for the second data obtained by permutating a bit of the first data.