The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Nov. 20, 2019
Gumi Electronics & Information Technology Research Institute, Gumi-si, Gyeongsangbuk-do, KR;
Abstract
A potential induced degradation test apparatus for a solar cell includes a PID test chamber (), a mounting unit (), one or more PID supply means of a PID test sheet () or a PID-causing substance supply unit (), a heating unit (), a voltage applying unit (), and a PID measuring unit (). The potential induced degradation test apparatus is capable of quantifying a level of a cell and durability against PID of individual configurational members such as an encapsulant of a solar cell module by a method of directly applying solid Na and vaporized Na ions quantified by minimum cell unit in a method in which large-area modularization of the solar cell module is not performed.
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