The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Jul. 31, 2014
Applicant:
Smiths Detection Inc., Edgewood, MD (US);
Inventor:
Vadym Berkout, Rockville, MD (US);
Assignee:
Smiths Detection Inc., Edgewood, MD (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/06 (2006.01); G01N 30/72 (2006.01); H01J 49/04 (2006.01); H01J 49/26 (2006.01); G01N 1/28 (2006.01); H01J 49/24 (2006.01);
U.S. Cl.
CPC ...
H01J 49/067 (2013.01); G01N 30/72 (2013.01); H01J 49/0404 (2013.01); H01J 49/26 (2013.01); G01N 1/28 (2013.01); H01J 49/24 (2013.01);
Abstract
An intermittent sample inlet device and methods for use of the intermittent sample inlet device are described that include an orifice plate with an entrance orifice and a rotating skimmer with a skimmer orifice, where the rotating skimmer is disposed between the orifice plate and a vacuum chamber wall. The rotating skimmer rotates so that the skimmer orifice intermittently aligns with the entrance orifice and allows an ion sample to pass through to a mass analyzer.