The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Dec. 15, 2015
Koninklijke Philips N.v., Eindhoven, NL;
Kishore Vinod, Bangalore, IN;
Cornelis Jacobus Hendrikus Adrianus Blom, Eindhoven, NL;
Prashanth Pai, Bothell, WA (US);
Santosh Yalawar, Bangalore, IN;
Paul Derckx, Best, NL;
Franciscus Johannes Maria Benschop, Best, NL;
Vinay Parthan, Best, NL;
Koninkliljke Philips N.V., Eindhoven, NL;
Abstract
A method for determining a quality rating data (QRD) of a medical data acquisition system (MDAS) includes receiving first data which includes utilization errors by an MDAS that occurred while performing a data acquisition procedure (DAP), by a data acquisition component of the MDAS, to acquire medical data. The method also includes generating second data as a function of the first data, the second data being indicative of categories of the utilization errors, wherein at least one utilization error is assigned to a corresponding category based on a predetermined parameter. The method further includes determining the quality rating data as a function of a total number of MDAS utilizations, a corresponding coefficient for the corresponding utilization error category and a number of utilization errors in the corresponding error category.