The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Feb. 13, 2019
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-Do, KR;

Inventors:

Han-Jun Lee, Gyeonggi-Do, KR;

Seung-Bum Kim, Gyeonggi-Do, KR;

Chul-Bum Kim, Seoul, KR;

Seung-Jae Lee, Gyeonggi-Do, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/28 (2006.01); G11C 16/34 (2006.01); G11C 16/16 (2006.01); G11C 8/14 (2006.01); G11C 16/24 (2006.01); G11C 7/18 (2006.01); G11C 16/08 (2006.01); G11C 29/08 (2006.01); G11C 7/04 (2006.01);
U.S. Cl.
CPC ...
G11C 16/28 (2013.01); G11C 7/04 (2013.01); G11C 7/18 (2013.01); G11C 8/14 (2013.01); G11C 16/08 (2013.01); G11C 16/16 (2013.01); G11C 16/24 (2013.01); G11C 16/3431 (2013.01); G11C 29/08 (2013.01);
Abstract

A memory device includes multiple word lines. A method of operating the memory device includes: performing a first dummy read operation, with respect to first memory cells connected to a first word line among the word lines, by applying a dummy read voltage, having an offset level of a first level, to the first word line; determining, based on a result of the performing of the first dummy read operation, degradation of a threshold voltage distribution of the first memory cells; adjusting an offset level of the dummy read voltage as a second level, based on a result of the determining of the threshold voltage distribution; and performing a second dummy read operation with respect to second memory cells connected to a second word line among the word lines, by applying a dummy read voltage, having the offset level adjusted as the second level, to the second word line among the word lines.


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