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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10733734 B1

PDFFull Text
Date of Patent:
Aug. 04, 2020

Filed:

Aug. 08, 2017

Image analysis apparatus, image analysis system, image analysis apparatus operation method to analyze brightness change of subject

Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Tetsuhiro Yamada, Hino, JP;

Momoko Yamanashi, Tachikawa, JP;

Toshio Nakamura, Hachioji, JP;

Ryuichi Toyama, Hachioji, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:

Scully, Scott, Murphy & Presser, P.C.

Primary Examiner:

Justin P Misleh

Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 1/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0016 (2013.01); A61B 1/00009 (2013.01); A61B 2576/00 (2013.01); G06T 2207/10068 (2013.01); G06T 2207/30028 (2013.01);
Abstract

An image analysis apparatus includes a processor including hardware. The processor extracts parts from each of a first image and a second image acquired after the first image, each of the extracted parts including an annular peripheral portion and a central portion having a color different from a color of the peripheral portion. The processor also sets the central portion as the analysis object region and calculates a brightness decrease degree of the analysis object region in the second image relative to the analysis object region in the first image.

Find Patent Forward Citations

Yamada, Tetsuhiro. (2020). Image analysis apparatus, image analysis system, image analysis apparatus operation method to analyze brightness change of subject (U.S. Patent No. 10733734). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10733734

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