The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
May. 22, 2018
Midea Group Co., Ltd., Foshan, CN;
Liang Diao, Foshan, CN;
Haisong Gu, Foshan, CN;
MIDEA GROUP CO., LTD., Foshan, CN;
Abstract
A method of performing automated object inspection includes obtaining a plurality of test images. For each of the plurality of test images, the method includes quantitatively determining a respective transformation from a predefined contour of the reference marker in the predefined common layout to a respective anchor contour corresponding to the reference marker as captured in the test image; and applying an inverse of the respective transformation to at least a portion of the test image to obtain a respective regularized version of the test image, such that the reference markers captured in the respective regularized versions of the plurality of test images share an image-independent location and orientation. The method further includes performing independent automated inspection on each of two or more sub-portions of the respective regularized versions of the test images.