The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
May. 18, 2018
Nec Laboratories America, Inc., Princeton, NJ (US);
Alexandru Niculescu-Mizil, Plainsboro, NJ (US);
Eric Cosatto, Red Bank, NJ (US);
Felix Wu, Ithaca, NY (US);
NEC Corporation, , JP;
Abstract
Systems and methods for detecting and correcting defective products include capturing at least one image of a product with at least one image sensor to generate an original image of the product. An encoder encodes portions of an image extracted from the original image to generate feature space vectors. A decoder decodes the feature space vectors to reconstruct the portions of the image into reconstructed portions by predicting defect-free structural features in each of the portions according to hidden layers trained to predict defect-free products. Each of the reconstructed portions are merged into a reconstructed image of a defect-free representation of the product. The reconstructed image is communicated to a contrastor to detect anomalies indicating defects in the product.