The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Sep. 30, 2014
Amazon Technologies, Inc., Seattle, WA (US);
Christopher Andrew Stephens, Issaquah, WA (US);
Alexander Clark Prater, Seattle, WA (US);
Alexander Michael McNamara, Seattle, WA (US);
Sridhar Boyapati, Sammamish, WA (US);
David Echevarria Ignacio, Seattle, WA (US);
David William Bettis, Seattle, WA (US);
Korwin Jon Smith, Seattle, WA (US);
Kevin Alexander Lee, Seattle, WA (US);
Aaron Craig Thompson, Seattle, WA (US);
Gary Paolo Raden, Seattle, WA (US);
Sudarshan Narasimha Raghavan, Snoqualmie, WA (US);
Dilip Kumar, Seattle, WA (US);
Félix Joseph Étienne Pageau, Seattle, WA (US);
AMAZON TECHNOLOGIES, INC., Seattle, WA (US);
Abstract
Described is an interactive data processing system configured to facilitate selection by a human associate of tentative values generated by an automated system from sensor data. In one implementation, an event may take place in a materials handling facility. The event may comprise a pick or place of an item from an inventory location, movement of a user, and so forth. The sensor data associated with the event is processed by an automated system to determine tentative values associated with the event. In some situations, an uncertainty may exist as to which of the tentative values accurately reflects the actual event. The sensor data and tentative values may be provided to a human associate. The associate may select one of the tentative values. The selected tentative value and the sensor data may be used to train the automated system.