The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Sep. 30, 2016
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Amihai Savir, Sansana, IL;

Nimrod Milo, Gedera, IL;

Oshry Ben-Harush, Kibutz Galon, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06N 5/04 (2006.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06F 11/3006 (2013.01); G06F 11/3452 (2013.01); G06N 20/00 (2019.01);
Abstract

Methods and apparatus are provided for multi-site time series data analysis. An exemplary method comprises obtaining a plurality of vectors over a period of time, wherein each vector comprises a local health score from each of a plurality of distributed sites that perform operational analytics on time-series data; determining a distribution of the vectors during a training phase; and calculating a global health score for the plurality of distributed sites for a given vector during a prediction phase based on a distance of the given vector from a center of mass of the distribution. Feedback is optionally provided to individual sites, such as an indication of a local health score of an individual site relative to the global health score, and adjustments to thresholds and/or parameters used by the individual site.


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