The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Mar. 09, 2016
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Kentarou Yabuki, Tokyo, JP;

Assignee:

NEC CORPORATION, Minato-ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/00 (2020.01); G06F 11/34 (2006.01); G05B 23/02 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 30/00 (2020.01); G05B 23/0243 (2013.01); G06F 11/34 (2013.01); G06F 11/3013 (2013.01); G06F 11/3452 (2013.01);
Abstract

Monitoring of a state of a system can be accurately performed even when a timing at which a relation changes is different for each set of the metrics. A monitoring apparatusincludes a model storage unitand a determination unit. The model storage unitstores, for each of a plurality of metric sets in a system, a model representing a relation among metrics included in the corresponding metric set. The determination unitdetermines and outputs whether the system is in one state, by comparing a combination of models to which the plurality of metric sets conform respectively when the system is in the one state and a combination of models to which the plurality of metric sets conform respectively when the system is in a state to be determined.


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