The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Aug. 23, 2019
Applicant:

Denso Corporation, Kariya, Aichi-pref., JP;

Inventors:

Tatsuya Yamashita, Kariya, JP;

Kenji Yamada, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 13/38 (2006.01); G06F 9/50 (2006.01);
U.S. Cl.
CPC ...
G06F 13/38 (2013.01); G06F 9/5027 (2013.01); G06F 2213/40 (2013.01);
Abstract

A microcomputer including first and second CPUs is provided. The first and second CPUs may execute identical control programs in parallel. The microcomputer may control a write access by the first or second CPU. The microcomputer may compare an output of the first CPU with an output of the second CPU. Data is written to a write target unit. The microcomputer outputs a write response signal to the first and second CPUs when a data write destination of the first and second CPUs is the write target unit. The microcomputer outputs an abnormality determination signal when data output from the first CPU mismatches with data output from the second CPU. The microcomputer writes the data to the write target unit when the data write destination of the first and second CPUs is the write target unit and the abnormality determination signal is not input.


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