The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Aug. 22, 2018
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Rohan Bavishi, Berkeley, CA (US);

Hiroaki Yoshida, Cupertino, CA (US);

Mukul R. Prasad, San Jose, CA (US);

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 8/30 (2018.01);
U.S. Cl.
CPC ...
G06F 11/3608 (2013.01); G06F 8/30 (2013.01);
Abstract

Operations may include identifying an edit that corresponds to a fault of a program. The edit may be identified based on a difference between the program and an improved program. The operations may include obtaining an AST that represents the program and includes defect nodes that correspond to a fault location and include an edit node. The operations may include classifying a particular node as a primary node that operates as a starting point for the edit. The operations may include identifying a path from the primary node to the edit node. The operations may include generating a fix pattern based on the path and the edit. The operations may include performing repairs with respect to an identified fault of code. The repairs may be performed using the fix pattern and based on the identified fault of the code being the same type as the fault of the program.


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