The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Jul. 21, 2017
Applicant:
Emc Ip Holding Company, Llc, Hopkinton, MA (US);
Inventors:
Eric Zhanqing Wu, Shanghai, CN;
Haitao Kenny Zhou, Shanghai, CN;
Jun Wu, Shanghai, CN;
Yourong Wang, Shanghai, CN;
Michael G. Varteresian, Lexington, MA (US);
Assignee:
EMC IP Holding Company LLC, Hopkinton, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01); G06F 13/00 (2006.01); G06F 13/28 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0631 (2013.01); G06F 3/0604 (2013.01); G06F 3/067 (2013.01);
Abstract
A method, computer program product, and computing system for receiving usage and configuration data from a storage system. The usage and configuration data is compared to one or more best practice models to determine one or more recommendations. The one or more recommendations are provided to a user of the storage system.
Wu, Eric. (2020). Best practice system and method (U.S. Patent No. 10732867). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10732867
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile