The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Apr. 19, 2018
Applicant:
California Institute of Technology, Pasadena, CA (US);
Inventors:
Mooseok Jang, Seoul, KR;
Yu Horie, Pasadena, CA (US);
Atsushi Shibukawa, Pasadena, CA (US);
Andrei Faraon, La Canada Flintridge, CA (US);
Changhuei Yang, South Pasadena, CA (US);
Assignee:
CALIFORNIA INSTITUTE OF TECHNOLOGY, Pasadena, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/01 (2006.01); G02B 5/00 (2006.01); G02B 1/00 (2006.01); G02B 5/02 (2006.01);
U.S. Cl.
CPC ...
G02F 1/0102 (2013.01); G02B 1/00 (2013.01); G02B 1/002 (2013.01); G02B 5/00 (2013.01); G02B 5/0236 (2013.01); G02F 2202/10 (2013.01); G02F 2202/36 (2013.01); G02F 2203/12 (2013.01); G02F 2203/50 (2013.01);
Abstract
Complex wavefront engineering is realized through a random metasurface phase mask backed by a phase-only spatial light modulator. The metasurface consists of an array of subwavelength nanoscatterers which give the metasurface a pre-arranged disorder. Since the transmission matrix of the disordered metasurface is known, there is no need for extensive characterization measurements which are instead required in standard disordered optical devices.