The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Dec. 08, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Michiie Sakamoto, Tokyo, JP;

Akinori Hashiguchi, Tokyo, JP;

Shinobu Masuda, Tokyo, JP;

Tsuguhide Sakata, Machida, JP;

Osamu Nagatsuka, Kawasaki, JP;

Koichiro Nishikawa, Takasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/26 (2006.01); G02B 21/24 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/26 (2013.01); G02B 21/361 (2013.01); G02B 21/362 (2013.01); G02B 21/241 (2013.01);
Abstract

A microscope system comprises a microscope body, an imaging unit connected to the microscope body and including an image sensor for capturing a microscopic image, and an XY stage configured to place a slide and move in an X direction and a Y direction. The microscope system changes an arrangement of the image sensor with respect to the microscope body so as to cause a direction defined by a pixel arrangement of the image sensor to align with one of the X direction and the Y direction of the XY stage.


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