The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Feb. 17, 2018
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Frank Wippermann, Meiningen, DE;
Andreas Brueckner, Jena, DE;
Andreas Braeuer, Schloeben, DE;
Alexander Oberdoerster, Jena, DE;
Abstract
Providing a multi-aperture imaging device having a single-line array of optical channels arranged next to one another with and adjuster for channel-specifically changing a relative position between an image sensor region of a respective optical channel, the optics of the respective optical channel and a beam-deflecting device of the respective channel or for channel-specifically changing an optical characteristic of the optics of the respective optical channel or an optical characteristic of the beam-deflecting device relating to deflecting the optical path of the respective optical channel, and a storage having default values stored therein and/or a controller for converting sensor data to default values for channel-specifically controlling the adjusting device is used to reduce requirements to, for example, manufacturing tolerances of the multi-aperture imaging device and/or requirements to the multi-aperture imaging device as regards position and shape invariance relative to temperature variations such that the additional complexity entailed by this procedure is compensated again.