The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Mar. 27, 2018
Applicant:

Agc Inc., Chiyoda-ku, JP;

Inventors:

Yuko Tachibana, Chiyoda-ku, JP;

Yukihiro Tao, Chiyoda-ku, JP;

Kenta Sekikawa, Chiyoda-ku, JP;

Assignee:

AGC Inc., Chiyoda-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/02 (2006.01); G03B 21/14 (2006.01); G03B 21/60 (2014.01); G02B 27/01 (2006.01);
U.S. Cl.
CPC ...
G02B 5/0221 (2013.01); G02B 5/02 (2013.01); G02B 5/0226 (2013.01); G02B 27/0101 (2013.01); G03B 21/14 (2013.01); G03B 21/60 (2013.01);
Abstract

To provide an image projecting structure having a wide viewing angle and whereby the visibility of a projected image is high. The image projecting structure comprises a first transparent layer having irregularities formed on its surface, a reflective film formed on the surface on which the irregularities are formed, of the first transparent layer, and a second transparent layer formed on the reflective film, wherein the transmittance of visible light is from 5 to 95%; the value obtained by dividing the haze by the diffuse reflectance of visible light is at least 0.1 and at most 1; the vertical difference Sk in the core section defined by ISO 25178, of the surface on which the irregularities are formed, is at least 0.1 μm; and the value obtained by dividing the shortest autocorrelation length Sal by the vertical difference Sk in the core section is at least 1.2 and at most 190.


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