The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Dec. 21, 2015
Applicants:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Universite D'aix-marseille, Marseilles, FR;

Inventors:

Laurent Ottaviani, Marseilles, FR;

Vanessa Vervisch, Marseilles, FR;

Fatima Issa, Marseilles, FR;

Abdallah Lyoussi, Manosque, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 3/08 (2006.01); H01L 31/118 (2006.01); G01T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01T 3/08 (2013.01); H01L 31/1185 (2013.01); G01T 7/00 (2013.01);
Abstract

A method for producing a device for detecting flux of neutrons with parameters in predetermined ranges, including: one phase of determining parameters, including: simulating penetration of a flux of incident neutrons with parameters in the predetermined ranges through a modelled stack including in succession and in order at least: one first electrode; one substrate including: a first layer; and a second layer; and one second electrode; and simulating at least one defect peak created in the first layer by vacancies and/or ionization of the particles generated by collisions between neutrons of the flux of incident neutrons and atoms of the second dopant species; and identifying depth of the defect peak closest the interface between the first and second layers of the modelled stack.


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