The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Jul. 28, 2017
The Boeing Company, Chicago, IL (US);
Liam Antonio Wingert, Seattle, WA (US);
Chris A. Cantrell, Seattle, WA (US);
Anthony W. Baker, Gilbertsville, PA (US);
Kenneth Paul Bowers, III, Smyma, GA (US);
James A. Grossnickle, Bellevue, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method for live metrology of an object includes performing a scanning operation by a plurality of sensors to collect electronic images of an object. The electronic images include 3-D point cloud data for live metrology of the object and the point cloud data from each sensor define a point cloud that represents the object. The method also includes stitching the point clouds from the plurality of sensors to generate a reconstructed model of an as-manufactured object. The method further includes comparing the reconstructed model of the as-manufactured object to an as-designed model of the object to determine that the object is manufactured within an allowable tolerance to the as-designed model of the object.