The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Nov. 10, 2015
Ether Capital Corporation, Wilmington, DE (US);
Ruska Patton, Calgary, CA;
Kasra Payandehjoo, Calgary, CA;
Ether Capital Corporation, Wilmington, DE (US);
Abstract
A method of calibrating or correcting near field or far field data from a scanner board array of integrated measuring probes that are electronically switched to capture near-field data from an antenna-under-test (AUT) and having a board output includes the steps of coupling a calibrating probe with one of the measuring probes, measuring the power through the measuring probe and the calibrating probe and isolating the effect of the RF path from the measuring probe to the board output by removing the effect of the calibrating probe, and repeating for each measuring probe. Also disclosed are methods for correcting for scattering effects and loading effects on the AUT.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile