The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Jun. 04, 2018
Mediatek Singapore Pte. Ltd., Singapore, SG;
Henry Arnold Park, San Jose, CA (US);
Tamer Mohammed Ali, San Jose, CA (US);
Shih-Hao Huang, Hsinchu, TW;
Chien-Hua Wu, Hsinchu, TW;
MEDIATEK Singapore Pte. Ltd., Singapore, SG;
Abstract
Systems and methods for detecting the presence and/or location of defects (e.g., incomplete solders, broken cables, misconnections, defective sockets, opens, shorts, etc.) along electrical lines are described. The systems and methods described herein may use time-domain reflectometry (TDR), a measurement technique used to determine the characteristics of electrical lines by observing reflected waveforms. TDR may be performed in some embodiments by determining the times when a first event and a second event occur, and by determining the space traveled by a probe signal based on these times. The first event may occur when a first signal transition crosses a first threshold and the second event may occur when a second signal transition crosses a second threshold, where the second signal transition may arise in response to the first signal transition reflecting against a defect along the electrical line.