The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Aug. 14, 2017
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Florian Gerbl, Olching, DE;
Chlodwig Neuhaeusler, Woerthsee, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A method for measuring beam steering characteristics of a device under test using a measurement system comprising a probe array with at least two field probes. The field probes can be arranged at different angles with respect to the device under test. A reference unit for calibrating the probe array is provided. At least two calibration measurements with different main radiation directions of the reference unit are performed wherein a predefined number of field probes of the probe array is used for measuring the radiation pattern of the reference unit. A calibration dataset for at least each field probe of the predefined number of field probes and each radiation direction is generated and stored. The reference unit is replaced by a device under test such that the device under test is located at the same measurement position as the reference unit was during the calibration measurements. A measurement of the device under test is performed by using the predefined number of field probes of the probe array.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile