The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

May. 22, 2015
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Satoru Chida, Tokyo, JP;

Kazuhiro Nakamura, Tokyo, JP;

Yoshihiro Suzuki, Tokyo, JP;

Toshihide Orihashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/04 (2006.01); G01N 35/00 (2006.01); B25J 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); B25J 15/0038 (2013.01); G01N 35/0099 (2013.01);
Abstract

An automatic analyzer has a transport device which includes a specimen rack gripping mechanism that grips the specimen rack on a first transport path on which the specimen racks are transported by the specimen rack being sandwiched between gripping plates from both sides of flanks in the transport direction to transport the specimen rack along the first transport path and a gripping width controller that controls a distance between the gripping plates of the specimen rack gripping mechanism in accordance with a width of the specimen rack. Accordingly, an automatic analyzer capable of transporting a plurality of types of the specimen racks while suppressing an increase in size of the apparatus and also an increase in cost can be provided.


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