The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Apr. 14, 2015
Applicant:

Dh Technologies Development Pte. Ltd., Singapore, SG;

Inventor:

Gordana Ivosev, Etobicoke, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01); G01N 30/96 (2006.01); H01J 49/00 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8631 (2013.01); G01N 30/8634 (2013.01); G01N 30/96 (2013.01); G01N 30/72 (2013.01); G01N 30/8637 (2013.01); H01J 49/004 (2013.01);
Abstract

Systems and methods are provided for calculating the area of a peak profile using information from one or more correlated peak profiles. One or more compounds are separated from a mixture over time using a separation device. Traces of the one or more compounds are monitored during the separation using a tandem mass spectrometer. A plurality of intensity measurements are received using a processor. A first peak profile for a compound of interest is detected from the plurality of intensity measurements for a first trace and one or more correlated peak profiles for the compound of interest are detected from the plurality of intensity measurements for one or more other traces using the processor. An area of the first peak profile is calculated based on the one or more correlated peak profiles using the processor.


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