The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Nov. 28, 2017
Applicant:
Sumitomo Chemical Company, Limited, Tokyo, JP;
Inventors:
Yoshitaka Shinomiya, Daegu, KR;
Koji Kashu, Niihama, JP;
Assignee:
SUMITOMO CHEMICAL COMPANY, LIMITED, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/84 (2006.01); G01N 21/896 (2006.01); G01N 23/083 (2018.01); H01M 2/14 (2006.01); H01M 2/16 (2006.01); H01M 10/48 (2006.01); H01M 10/0525 (2010.01);
U.S. Cl.
CPC ...
G01N 21/896 (2013.01); G01N 23/083 (2013.01); H01M 2/145 (2013.01); H01M 2/1653 (2013.01); H01M 10/48 (2013.01); H01M 2/166 (2013.01); H01M 2/1686 (2013.01); H01M 10/0525 (2013.01);
Abstract
To inspect a separator roll for a defect inside the separator roll with use of only a small number of defect inspection devices, a defect inspection device () includes: a radiation source section () configured to emit an electromagnetic wave () to a separator roll (); and a sensor section () configured to detect the electromagnetic wave () having passed through the separator roll ().