The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Oct. 17, 2018
Rigaku Analytical Devices, Inc., Wilmington, MA (US);
Michael Anthony Damento, Tucson, AZ (US);
Scott Charles Buchter, Espoo, FI;
Stanislaw Piorek, Hillsborough, NJ (US);
Rigaku Analytical Devices, Inc., Wilmington, MA (US);
Abstract
A device for analyzing the material composition of a sample via plasma spectrum analysis includes a laser assembly configured to emit a beam for plasma spectrum analysis, an optical assembly configured to direct the beam towards a sample for plasma spectrum analysis of the sample and collect a reflected light reflected by the sample. The optical assembly includes a long-wave pass optical filter arrangement which is configured to pass a first portion of the reflected light reflected by the sample and reflect a second portion of the reflected light reflected by the sample to a spectrometer.