The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Jul. 11, 2017
Applicants:

Centre National DE LA Recherche Scientifique—cnrs—, Paris, FR;

Ecole Supérieure DE Physique ET DE Chimie Industrielles DE LA Ville DE Paris, Paris, FR;

Inventors:

Emmanuel Fort, Cachan, FR;

Sandrine Leveque-Fort, Cachan, FR;

Nicolas Bourg, Ivry sur Seine, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 21/16 (2006.01); G02B 21/14 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G01N 21/6428 (2013.01); G01N 21/6445 (2013.01); G02B 21/0068 (2013.01); G02B 21/14 (2013.01); G02B 21/16 (2013.01); G01N 2021/6439 (2013.01); G01N 2021/6463 (2013.01); G02B 21/0076 (2013.01);
Abstract

Method and system for measuring a physical parameter of a target region of a medium are provided, wherein: an excitation wave having a periodic modulation over time of a physical characteristic is emitted, a return wave is periodically deflected with a controllable deflecting element so that the deflected wave scans a transducer array, each transducer being associated with a predefined phase range of the periodic modulation, a phase image is recorded during at least one period of the periodic modulation, a phase shift between a periodic modulation of the return wave and the periodic modulation of the excitation wave is determined from the phase image, a physical parameter of the target region is determined from the phase shift.


Find Patent Forward Citations

Fort, Emmanuel. (2020). System and method for measuring a physical parameter of a medium (U.S. Patent No. 10732114). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10732114

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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