The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Sep. 18, 2017
Applicant:

Sony Corporation, Tokyo, JP;

Inventor:

Yosuke Muraki, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 21/64 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1429 (2013.01); G01N 15/1459 (2013.01); G01N 21/6486 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/149 (2013.01); G01N 2021/6421 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/12 (2013.01);
Abstract

Provided are a fine particle analyzing apparatus, a fine particle analyzing method, a program, and a fine particle analyzing system, which are capable of easily separating a plurality of types of spectral data on fluorescence emitted from a fine particle. A data extracting unit included in the fine particle analyzing apparatus selectively extracts spectral data, which contain predetermined information, from spectral data on fluorescence emitted from a fine particle. The data extracting unit selectively extracts spectral data indicating the maximum intensity in a wavelength area set beforehand from one or a plurality of types of spectral data indicating intensity of fluorescence emitted from the fine particle for each of a plurality of wavelengths.


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