The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Oct. 04, 2017
Applicant:

United States of America As Represented BY the Administrator of Nasa, Washington, DC (US);

Inventors:

William L Ko, Lancaster, CA (US);

Van T Fleischer, Lancaster, CA (US);

Shun-Fat Lung, Valencia, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 5/00 (2006.01); G01B 7/16 (2006.01);
U.S. Cl.
CPC ...
G01M 5/0041 (2013.01); G01B 7/16 (2013.01); G01M 5/0016 (2013.01);
Abstract

The invention is a method for obtaining the curved displacement of a flexible structure by using strain measurements obtained by strain sensors. By obtaining the displacement of structures in this manner, one may accurately construct the deformed shape of the structure under large geometric nonlinear deformations and display said deformed shape in real-time, enabling active control of the structure shape if desired.


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