The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Apr. 01, 2019
Applicant:

Corning Incorporated, Corning, NY (US);

Inventors:

Ryan Claude Andrews, Elmira, NY (US);

Chai Hsin Kuang, Taipei, TW;

Rostislav Vatchev Roussev, Painted Post, NY (US);

Assignee:

CORNING INCORPORATED, Corning, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G01L 1/24 (2006.01); G01J 3/447 (2006.01); G01N 33/38 (2006.01); G01N 21/23 (2006.01); G01N 21/43 (2006.01);
U.S. Cl.
CPC ...
G01L 1/24 (2013.01); G01J 3/447 (2013.01); G01N 21/23 (2013.01); G01N 21/43 (2013.01); G01N 33/386 (2013.01);
Abstract

The prism-coupling systems and methods include using a prism-coupling system to collect initial TM and TE mode spectra of a chemically strengthened article having a refractive index profile with a near-surface spike region and a deep region. The initial TM and TE mode spectra are examined to see if they fall within a preferred measurement window that can produce an accurate estimate of the knee stress to within a select tolerance. If not, then measurement configuration of the prism-coupling system is changed and new TM and TE mode spectra are collected. This process is repeated until the new TM and TE mode spectra fall within the preferred measurement window. The new TM and TE mode spectra are then used to determine the knee stress. Changing the measurement configuration can include changing at least one of the measurement wavelength, interfacing fluid thickness and interfacing fluid refractive index.


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