The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Dec. 05, 2019
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Erika Ye, Saratoga, CA (US);

Amir H. Atabaki, Brookline, MA (US);

Ningren Han, Cambridge, MA (US);

Rajeev J. Ram, Arlington, MA (US);

William F. Herrington, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/453 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/453 (2013.01); G01J 3/0256 (2013.01); G01J 3/0259 (2013.01); G01J 3/4531 (2013.01); G01J 3/4532 (2013.01);
Abstract

A non-paraxial Talbot spectrometer includes a transmission grating to receive incident light. The grating period of the transmission grating is comparable to the wavelength of interest so as to allow the Talbot spectrometer to operate outside the paraxial limit. Light transmitted through the transmission grating forms periodic Talbot images. A tilted detector is employed to simultaneously sample the Talbot images at various distances along a direction perpendicular to the grating. Spectral information of the incident light can be calculated by taking Fourier transform of the measured Talbot images or by comparing the measured Talbot images with a library of intensity patterns acquired with light sources having known wavelengths.


Find Patent Forward Citations

Loading…