The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Dec. 13, 2017
Applicant:
Here Global B.v., Eindhoven, NL;
Inventors:
Bishnu Phuyal, Mt. Prospect, IL (US);
Bo Xu, Lisle, IL (US);
Assignee:
HERE Global B.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/26 (2006.01); G01C 21/32 (2006.01); G01C 21/36 (2006.01); G09B 29/00 (2006.01); G09B 29/10 (2006.01); G08G 1/01 (2006.01);
U.S. Cl.
CPC ...
G01C 21/26 (2013.01); G01C 21/32 (2013.01); G01C 21/3658 (2013.01); G08G 1/0104 (2013.01); G08G 1/0112 (2013.01); G09B 29/007 (2013.01); G09B 29/10 (2013.01);
Abstract
Systems, methods, and apparatuses are described for determining turn lane data from probe data. Probe data for an intersection including locations and headings is identified. The probe data for the intersection is divided into a first trace and a second trace based on locations. The difference in the headings, heading change data, is calculated. From the heading change data, at least two local extrema points are identified. A characteristic of the turning lane is determined based on the at least two local extrema points.